The range of features available in Proceed can be classified into the following categories:

Chart Options

Analysis Options

Gauge Enabled

Chart Options

Proceed provides a very wide range of designs, including the following:

• X-bar/R
• X-bar/s
• X/mR
• X-bar/mR
• EWMA 
• CUSUM
• p 
• np
• c
• u 

Proceed includes both short-run and multiple defect SPC

Analysis Options

Included in the analysis options are the following:

• Capability Analysis Cp, Cpk

• Normal Plot

• Normality Checking

• Scree Plot

• Basic Statistics (Mean, Median, Standard Deviation, Skewness and Kurtosis)

• % above and % below USL and LSL respectively

• 2 sample t-test

• 2 sample F-test

• Analysis of Means (ANOM)

• Grubb's Outlier Test

• Multiple Variance Test

• Cochran's C Test

• Defect Cost Analysis

• Stem & Leaf Plot

• Box & Whisker Plot

• Pareto Chart

• Bar Chart

Gauge Enabled

A gauge enabled version of Proceed is available. For more details click here.